<?xml version="1.0" encoding="utf-8" standalone="yes"?><rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>Materials Characterization |</title><link>https://example.com/tags/materials-characterization/</link><atom:link href="https://example.com/tags/materials-characterization/index.xml" rel="self" type="application/rss+xml"/><description>Materials Characterization</description><generator>HugoBlox Kit (https://hugoblox.com)</generator><language>en-us</language><lastBuildDate>Sun, 01 Mar 2026 00:00:00 +0000</lastBuildDate><image><url>https://example.com/media/icon_hu_702a800cd775dbac.png</url><title>Materials Characterization</title><link>https://example.com/tags/materials-characterization/</link></image><item><title>Materials Characterization</title><link>https://example.com/skills/materials-characterization/</link><pubDate>Sun, 01 Mar 2026 00:00:00 +0000</pubDate><guid>https://example.com/skills/materials-characterization/</guid><description>&lt;h2 id="techniques"&gt;Techniques:&lt;/h2&gt;
&lt;p&gt;Raman, FT-IR, XPS, XRD, EDX, SEM, TEM.
Used for structural, chemical, thermal, and morphological characterization of advanced materials for electrochemical and thermal energy systems.&lt;/p&gt;
&lt;h3 id="materials-characterization-techniques--instrumentation"&gt;Materials Characterization Techniques &amp;amp; Instrumentation:&lt;/h3&gt;
&lt;ul&gt;
&lt;li&gt;
&lt;p&gt;&lt;strong&gt;Raman spectroscopy&lt;/strong&gt; - Performed Raman analysis to evaluate graphitic structure, defect density, and doping effects in graphene-based materials; interpreted D, G, and 2D band features to assess structural quality and material evolution during synthesis and processing.&lt;/p&gt;
&lt;/li&gt;
&lt;li&gt;
&lt;p&gt;&lt;strong&gt;FTIR spectroscopy&lt;/strong&gt; - Used FTIR to identify functional groups and chemical bonding in nanomaterials and composite systems; applied to monitor surface functionalization and chemical interactions between nanomaterials and host matrices.&lt;/p&gt;
&lt;/li&gt;
&lt;li&gt;
&lt;p&gt;&lt;strong&gt;X-ray photoelectron spectroscopy (XPS)&lt;/strong&gt; - Conducted XPS analysis to determine surface elemental composition, bonding states, and nitrogen doping configurations in carbon-based materials; used for surface chemistry evaluation and catalyst active-site analysis.&lt;/p&gt;
&lt;/li&gt;
&lt;li&gt;
&lt;p&gt;&lt;strong&gt;X-ray diffraction (XRD)&lt;/strong&gt; - Applied XRD to characterize crystal structure, phase composition, and structural evolution of nanomaterials including MOFs and graphitic materials; used to assess crystallinity and phase stability after synthesis or thermal treatment.&lt;/p&gt;
&lt;/li&gt;
&lt;li&gt;
&lt;p&gt;&lt;strong&gt;Scanning electron microscopy (SEM)&lt;/strong&gt; - Utilized SEM to examine surface morphology, particle size, and microstructural features of nanomaterials and composite systems; supported structural analysis and morphology–performance correlations.&lt;/p&gt;
&lt;/li&gt;
&lt;li&gt;
&lt;p&gt;&lt;strong&gt;Transmission electron microscopy (TEM)&lt;/strong&gt; - Performed TEM imaging to investigate nanoscale structure, lattice features, and dispersion of nanomaterials within composite systems; used to evaluate particle morphology and structural integrity.&lt;/p&gt;
&lt;/li&gt;
&lt;li&gt;
&lt;p&gt;&lt;strong&gt;Energy-dispersive X-ray spectroscopy (EDS)&lt;/strong&gt; - Applied EDS elemental mapping and compositional analysis to confirm elemental distribution and composition in synthesized nanomaterials and composites.&lt;/p&gt;
&lt;/li&gt;
&lt;/ul&gt;
&lt;h3 id="materials-characterized"&gt;Materials Characterized:&lt;/h3&gt;
&lt;ul&gt;
&lt;li&gt;&lt;em&gt;Graphene, Graphene Oxide (GO), Nitrogen-doped Graphene (N-G)&lt;/em&gt;&lt;/li&gt;
&lt;li&gt;&lt;em&gt;Metal-organic Frameworks (MOF)&lt;/em&gt;&lt;/li&gt;
&lt;li&gt;&lt;em&gt;MXenes&lt;/em&gt;&lt;/li&gt;
&lt;li&gt;&lt;em&gt;Phase Change Materials (PCMs)&lt;/em&gt;&lt;/li&gt;
&lt;li&gt;&lt;em&gt;Composite materials&lt;/em&gt;&lt;/li&gt;
&lt;/ul&gt;</description></item></channel></rss>